Chinese Optics Letters, Vol. 4, Issue 12, 705 (2006)
A spectroscopic method for determining thickness of quartz wave plate
[in Chinese]1, [in Chinese]1, [in Chinese]2, [in Chinese]3, [in Chinese]1, and [in Chinese]1
- 1State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
- 2Remote Sensing Laboratory, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031
- 3College of Physics Science and Technology, China University of Petroleum, Qingdao 266555
A spectroscopic method to determine thickness of quartz wave plate is presented. The method is based on chromatic polarization interferometry. With the polarization-resolved transmission spectrum (PRTS) curve, the phase retardation of quartz wave plate can be determined at a wide spectral range from 200 to 2000 nm obviously. Through accurate judgment of extreme points of PRTS curve at long-wave band, the physical thickness of quartz wave plates can be obtained exactly. We give a measuring example and the error analysis. It is found that the measuring precision of thickness is mainly determined by the spectral resolution of spectrometer.