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  • Received: Jun. 27, 2006

    Accepted: --

    Posted: Dec. 30, 2006

    Published Online: Dec. 30, 2006

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A spectroscopic method for determining thickness of quartz wave plate[J]. Chinese Optics Letters, 2006, 4(12): 705

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Chinese Optics Letters, Vol. 4, Issue 12, 705 (2006)

A spectroscopic method for determining thickness of quartz wave plate

[in Chinese]1, [in Chinese]1, [in Chinese]2, [in Chinese]3, [in Chinese]1, and [in Chinese]1

Author Affiliations

  • 1State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
  • 2Remote Sensing Laboratory, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031
  • 3College of Physics Science and Technology, China University of Petroleum, Qingdao 266555

Abstract

A spectroscopic method to determine thickness of quartz wave plate is presented. The method is based on chromatic polarization interferometry. With the polarization-resolved transmission spectrum (PRTS) curve, the phase retardation of quartz wave plate can be determined at a wide spectral range from 200 to 2000 nm obviously. Through accurate judgment of extreme points of PRTS curve at long-wave band, the physical thickness of quartz wave plates can be obtained exactly. We give a measuring example and the error analysis. It is found that the measuring precision of thickness is mainly determined by the spectral resolution of spectrometer.

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