Main > Advanced Photonics >  Volume 1 >  Issue 2 >  Page 025001 > Article
  • Abstract
  • Abstract
  • Figures (7)
  • Tables (1)
  • Equations (0)
  • References (13)
  • Get PDF
  • View Full Text
  • Paper Information
  • Received: Aug. 22, 2018

    Accepted: Jan. 8, 2019

    Posted: Mar. 14, 2019

    Published Online: Mar. 14, 2019

    The Author Email: Chen Qian (chenqian@njust.edu.cn), Zuo Chao (zuochao@njust.edu.cn)

    DOI: 10.1117/1.AP.1.2.025001

  • Get Citation
  • Copy Citation Text

    Shijie Feng, Qian Chen, Guohua Gu, Tianyang Tao, Liang Zhang, Yan Hu, Wei Yin, Chao Zuo. Fringe pattern analysis using deep learning[J]. Advanced Photonics, 2019, 1(2): 025001

    Download Citation

  • Category
  • Letters
  • Share
Advanced Photonics, Vol. 1, Issue 2, 025001 (2019)

Fringe pattern analysis using deep learning 

Shijie Feng1,2,3, Qian Chen1,2,*, Guohua Gu1,2, Tianyang Tao1,2, Liang Zhang1,2,3, Yan Hu1,2,3, Wei Yin1,2,3, and Chao Zuo1,2,3,*

Author Affiliations

  • 1Nanjing University of Science and Technology, School of Electronic and Optical Engineering, Nanjing, China
  • 2Jiangsu Key Laboratory of Spectral Imaging and Intelligent Sense, Nanjing, China
  • 3Nanjing University of Science and Technology, Smart Computational Imaging Laboratory (SCILab), Nanjing, China

Abstract

In many optical metrology techniques, fringe pattern analysis is the central algorithm for recovering the underlying phase distribution from the recorded fringe patterns. Despite extensive research efforts for decades, how to extract the desired phase information, with the highest possible accuracy, from the minimum number of fringe patterns remains one of the most challenging open problems. Inspired by recent successes of deep learning techniques for computer vision and other applications, we demonstrate for the first time, to our knowledge, that the deep neural networks can be trained to perform fringe analysis, which substantially enhances the accuracy of phase demodulation from a single fringe pattern. The effectiveness of the proposed method is experimentally verified using carrier fringe patterns under the scenario of fringe projection profilometry. Experimental results demonstrate its superior performance, in terms of high accuracy and edge-preserving, over two representative single-frame techniques: Fourier transform profilometry and windowed Fourier transform profilometry.

keywords

Please Enter Your Email: