Chinese Optics Letters, Vol. 5, Issue 11, 660 (2007)
Analysis, fabrication, and measurement of Y aperture element frequency selective surface
Xiaoqiu Li1,2,*, Jianmin Zhou1,2, and Jinsong Gao3
- 1Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033
- 2Graduate School of the Chinese Academy of Sciences, Beijing 100039
- 3East China Jiaotong University, Nanchang 330013
The analysis of Y aperture element frequency selective surface (FSS) using the spectral domain method and the moment method is presented. With the vacuum depositing and photolithography, the corresponding Y aperture element FSS was produced, and it was tested in the microwave darkroom. The calculated and measured results are in good agreement.
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