Main > Chinese Journal of Lasers >  Volume 47 >  Issue 9 >  Page 0904001 > Article
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  • Received: Mar. 11, 2020

    Accepted: Apr. 15, 2020

    Posted: Sep. 1, 2020

    Published Online: Sep. 16, 2020

    The Author Email: Wu Sijin (swu@bistu.edu.cn)

    DOI: 10.3788/CJL202047.0904001

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    Tiancheng Liu, Sijin Wu, Weixian Li. Spatial Carrier Digital Speckle Pattern Interferometry System with Large Field of View[J]. Chinese Journal of Lasers, 2020, 47(9): 0904001

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Chinese Journal of Lasers, Vol. 47, Issue 9, 0904001 (2020)

Spatial Carrier Digital Speckle Pattern Interferometry System with Large Field of View

Liu Tiancheng, Wu Sijin*, and Li Weixian

Author Affiliations

  • School of Instrument Science and Opto Electronics Engineering, Beijing Information Science & Technology University, Beijing 100192, China

Abstract

The single measurement area in traditional spatial carrier digital speckle pattern interferometry (SC-DSPI) is limited by its small viewing angle owing to its optical path limitation. In this paper, a SC-DSPI optical path with a large field of view is proposed. A 4F optical system based on the traditional SC-DSPI optical path is added for image transmission, which enables a short-focus lens used in the optical path for imaging to expand the measurement viewing angle, thus realizing a large field of view measurement. The experiment results show that when the measurement distance is 310 mm, the proposed SC-DSPI optical path with a large field of view can realize the entire field deformation measurement of an object with a 180 mm diameter; the obtained phase diagram has high quality. The proposed SC-DSPI facilitates effective measurement.

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