Chinese Journal of Lasers, Vol. 47, Issue 9, 0904001 (2020)
Spatial Carrier Digital Speckle Pattern Interferometry System with Large Field of View
Liu Tiancheng, Wu Sijin*, and Li Weixian
- School of Instrument Science and Opto Electronics Engineering, Beijing Information Science & Technology University, Beijing 100192, China
The single measurement area in traditional spatial carrier digital speckle pattern interferometry (SC-DSPI) is limited by its small viewing angle owing to its optical path limitation. In this paper, a SC-DSPI optical path with a large field of view is proposed. A 4F optical system based on the traditional SC-DSPI optical path is added for image transmission, which enables a short-focus lens used in the optical path for imaging to expand the measurement viewing angle, thus realizing a large field of view measurement. The experiment results show that when the measurement distance is 310 mm, the proposed SC-DSPI optical path with a large field of view can realize the entire field deformation measurement of an object with a 180 mm diameter; the obtained phase diagram has high quality. The proposed SC-DSPI facilitates effective measurement.
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