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  • Received: Jun. 17, 2019

    Accepted: Aug. 22, 2019

    Posted: Dec. 3, 2019

    Published Online: Dec. 3, 2019

    The Author Email: Xianghui Wang (wangxianghui@nankai.edu.cn)

    DOI: 10.3788/COL201917.121103

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    Zhiyuan Gu, Xianghui Wang, Jianxin Wang, Fei Fan, Shengjiang Chang. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging[J]. Chinese Optics Letters, 2019, 17(12): 121103

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Chinese Optics Letters, Vol. 17, Issue 12, 121103 (2019)

Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging

Zhiyuan Gu, Xianghui Wang*, Jianxin Wang, Fei Fan, and Shengjiang Chang

Author Affiliations

  • Institute of Modern Optics, Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Nankai University, Tianjin 300350, China

Abstract

Subtractive imaging is used to suppress the axial sidelobes and improve the axial resolution of 4pi microscopy with a higher-order radially polarized (RP) Laguerre–Gaussian (LG) beam. A solid-shaped point spread function (PSF) and a doughnut-shaped PSF with a dark spot along the optical axis are generated by tightly focusing a higher-order RP-LG beam and a modulated circularly polarized beam, respectively. By subtracting the two images obtained with those two different PSFs, the axial sidelobes of the subtracted PSF are reduced from 37% to about 10% of the main lobe, and the axial resolution is increased from 0.21λ to 0.15λ.