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  • Received: Apr. 16, 2019

    Accepted: Jun. 24, 2019

    Posted: Oct. 1, 2019

    Published Online: Oct. 9, 2019

    The Author Email: Zou Ying (zouying@zjlab.org.cn), Wang Yong (wangyong@zjlab.org.cn), Tai Renzhong (tairenzhong@zjlab.org.cn)

    DOI: 10.3788/AOS201939.1034002

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    Junqin Li, Zhenhua Chen, Zilong Zhao, Ying Zou, Yong Wang, Renzhong Tai. Soft X-Ray Absorption Spectroscopy of Low Z Element Based on Fluorescence Emission[J]. Acta Optica Sinica, 2019, 39(10): 1034002

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Acta Optica Sinica, Vol. 39, Issue 10, 1034002 (2019)

Soft X-Ray Absorption Spectroscopy of Low Z Element Based on Fluorescence Emission

Li Junqin1,2, Chen Zhenhua1,2, Zhao Zilong1,2, Zou Ying1,2,*, Wang Yong1,2,**, and Tai Renzhong1,2,***

Author Affiliations

  • 1 Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2 Shanghai Synchrotron Radiation Facility, Zhangjiang Laboratory, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China

Abstract

We establish a measurement system based on low atomic number absorption spectrum of fluorescence emission via the beamline station 08U1A of Shanghai Synchrotron Radiation Source, and explore the partial fluorescence yield (PFY) based on absorption method. The feasibility and applicability of this setup is verified on low Z elements in soft condensed matter and semiconductor areas. The research objects of CF4 gas and iodine methylamine lead (CH3NH3PbI3) verify the feasibility of PFY absorption spectroscopy. Then the low limit of sensitivity to sample concentration is determined.

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