Chinese Optics Letters, Vol. 18, Issue 9, 092501 (2020)
Photonic-assisted single system for microwave frequency and phase noise measurement
Jingzhan Shi, Fangzheng Zhang*, De Ben, and Shilong Pan
- Key Laboratory of Radar Imaging and Microwave Photonics, Ministry of Education, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China
We propose a photonic-assisted single system for measuring the frequency and phase noise of microwave signals in a large spectral range. Both the frequency and phase noise to be measured are extracted from the phase difference between the signal under testing and its replica delayed by a span of fiber and a variable optical delay line (VODL). The system calibration, frequency measurement, and phase noise measurement are performed by adjusting the VODL at different working modes. Accurate frequency and phase noise measurement for microwave signals in a large frequency range from 5 to 50 GHz is experimentally demonstrated.
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