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  • Received: Nov. 1, 2006

    Accepted: --

    Posted: Aug. 8, 2007

    Published Online: Aug. 8, 2007

    The Author Email: Karsten Plamann (karsten.plamann@ensta.fr)

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    Gilbert Boyer, Karsten Plamann. Improving contrast and sectioning power in confocal imaging by third harmonic generation in SiOx nanocrystallites[J]. Chinese Optics Letters, 2007, 5(8): 477

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Chinese Optics Letters, Vol. 5, Issue 8, 477 (2007)

Improving contrast and sectioning power in confocal imaging by third harmonic generation in SiOx nanocrystallites

Gilbert Boyer and Karsten Plamann*

Author Affiliations

  • Laboratoire d'Optique Appliquee, Ecole Polytechnique-Ecole Nationale Superieure de Techniques Avancees-CNRS UMR 7639, Centre de l'Yvette, chemin de la Huniere, 91761 Palaiseau cedex, France

Abstract

We present a new optical microscope in which the light transmitted by a sample-scanned transmission confocal microscope is frequency-tripled by SiOx nanocrystallites in lieu of being transmitted by a confocal pinhole. This imaging technique offers an increased contrast and a high scattered light rejection. It is demonstrated that the contrast close to the Sparrow resolution limit is enhanced and the sectioning power are increased with respect to the linear confocal detection mode. An experimental implementation is presented and compared with the conventional linear confocal mode.

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