Main > Chinese Optics Letters >  Volume 13 >  Issue 2 >  Page 023101 > Article
  • Abstract
  • Abstract
  • Figures (8)
  • Tables (3)
  • Equations (0)
  • References (19)
  • Cited By (1/1)
  • Get PDF
  • View Full Text
  • Paper Information
  • Received: Jul. 31, 2014

    Accepted: Nov. 28, 2014

    Posted: Jan. 23, 2019

    Published Online: Sep. 25, 2018

    The Author Email: Yun Cui (cuiyun@siom.ac.cn)

    DOI: 10.3788/COL201513.023101

  • Get Citation
  • Copy Citation Text

    Yun Cui, Hao Li, Kui Yi, Jianda Shao. Moisture absorption characteristics of a SiO2 film from 2 to 3 μm[J]. Chinese Optics Letters, 2015, 13(2): 023101

    Download Citation

  • Category
  • Thin Films
  • Share
Chinese Optics Letters, Vol. 13, Issue 2, 023101 (2015)

Moisture absorption characteristics of a SiO2 film from 2 to 3 μm

Yun Cui*, Hao Li, Kui Yi, and Jianda Shao

Author Affiliations

  • Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

Abstract

We prepare SiO2 coatings on different substrates by either electron-beam evaporation or dual ion-beam sputtering. The relative transmittances of the SiO2 coatings are measured during the heating process. The SiO2 coating microstructures are studied. Results indicate that the intensity and peak position of moisture absorption are closely related to the microstructures of the coatings. The formation of microstructures depends not only on the preparation process of the coatings but also on the substrate characteristics.