Main > Chinese Optics Letters >  Volume 13 >  Issue 2 >  Page 023101 > Article
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Variations in the FTIR spectra of SiO2 coatings deposited by IBS as a function of heating temperature.

Fig. 1. Variations in the FTIR spectra of SiO2 coatings deposited by IBS as a function of heating temperature.

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Variations in the FTIR spectra of SiO2 coatings deposited by EBE as a function of heating temperature.

Fig. 2. Variations in the FTIR spectra of SiO2 coatings deposited by EBE as a function of heating temperature.

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Surface structures of the different substrates.

Fig. 3. Surface structures of the different substrates.

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Surface structures of coatings deposited by IBS on different substrates.

Fig. 4. Surface structures of coatings deposited by IBS on different substrates.

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Scanning electron microscopy (SEM) cross sectional morphology of a coating fabricated by IBS.

Fig. 5. Scanning electron microscopy (SEM) cross sectional morphology of a coating fabricated by IBS.

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Surface structures of SiO2 coatings deposited by EBE on different substrates.

Fig. 6. Surface structures of SiO2 coatings deposited by EBE on different substrates.

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SEM cross sectional morphology of a coating fabricated by EBE.

Fig. 7. SEM cross sectional morphology of a coating fabricated by EBE.

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Mean pore sizes of the SiO2 coatings prepared by EBE on different substrates.

Fig. 8. Mean pore sizes of the SiO2 coatings prepared by EBE on different substrates.

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