Main > HPArticle > Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre-Gaussian beam using subtractive imaging
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  • Manuscript Accepted: Aug. 22, 2019

    Online Published: Aug. 23, 2019

Chinese Optics Letters, 2019, Vol. 17, Issue 12, pp.

Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre-Gaussian beam using subtractive imaging

Gu Zhiyuan, Wang Xianghui, Wang Jianxin, Fan Fei , Chang Shengjiang

Author Affiliations

  • 天津 南开大学现代光学研究所
  • 南开大学现代光学研究所

Abstract

Subtractive imaging is used to suppress the axial sidelobes and improve the axial resolution of 4pi microscopy with higher-order radially polarized (RP) Laguerre-Gaussian (LG) beam. A solid-shaped point spread function (PSF) and a doughnut-shaped PSF with a dark spot along the optical axis are generated by tightly focusing higher-order RP-LG beam and modulated circularly polarized beam, respectively. By subtracting the two images obtained with those two different PSFs, the axial sidelobes of the subtracted PSF are reduced from 37% to about 10% of the main lobe and the axial resolution is increased from 0.21λ to 0.15λ.

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