Main > HPArticle > 3D detection for subtle traces with reflectance transformation imaging
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  • Manuscript Accepted: Jan. 12, 2021

    Online Published: Jan. 13, 2021

Chinese Optics Letters, 2021, Vol. 19, Issue 3, pp.

3D detection for subtle traces with reflectance transformation imaging [Early Posting]

Dai Jie, Huang Lihua, Zhu Xinran, Guo Kai, ling liqing, Huang Huijie

Author Affiliations

  • Shanghai Institute of Optics and Fine Mechanics Chinese Academy of Sciences
  • Shanghai Institute of Optics and Fine Mechanics Chinese Academy of Sciences
  • Shanghai Institute of Optics and Fine Mechanics Chinese Academy of Sciences
  • Shanghai Institute of Optics and Fine Mechanics Chinese Academy of Sciences

Abstract

This paper reports a detection method of two-dimensional (2D) enhancement and three-dimensional (3D) reconstruction for subtle traces with reflectance transformation imaging, which can effectively locate the trace area of interest and extract the normal data of this area directly. In millimeter- and micron-scale traces, during 3D construction, we presented a method of data screening, conversion, and amplification, which can successfully suppress noise, improve surface and edge quality, and enhance 3D effect and contrast. The method not only captures 2D and 3D morphologies of traces clearly but also obtains the sizes of these traces.

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