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Electron Beam-induced Degradation of Halide Perovskite-related Semiconductor Nanomaterials
Chinese Optics Letters, 2021, Vol. 19, Issue 3, pp.
Electron Beam-induced Degradation of Halide Perovskite-related Semiconductor Nanomaterials [Early Posting]
Dang Zhiya, Luo Yuqing, Wang Xue-Sen, Imran Muhammad, Gao Pingqi
Author Affiliations
- Sun Yat-Sen University
- Sun Yat-Sen University
- National University of Singapore
- Istituto Italiano di Tecnologia
- Sun Yat-Sen University
Abstract
The instability of lead halide perovskites in various application-related conditions is a key challenge to be resolved. We investigated the formation of metal nanoparticles during transmission electron microscopy (TEM) imaging of perovskite-related metal halide compounds. The metal nanoparticle formation on these materials originates from stimulated desorption of halogen under electron beam, and a subsequent aggregation of metal atoms. Based on shared mechanism, the TEM-based degradation test can help to evaluate the material stability against light irradiation.
